Volume 23 Issue 4
Dec.  2009
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Article Navigation >  Journal of Shanghai University of Engineering Science  > 2009  >  23(4): 353-357
SUN Hui, YAO Li. Design of Detection System for Electronic Scale Chip Cheating[J]. Journal of Shanghai University of Engineering Science, 2009, 23(4): 353-357. doi: 10.3969/j.issn.1009-444X.2009.04.017
Citation: SUN Hui, YAO Li. Design of Detection System for Electronic Scale Chip Cheating[J]. Journal of Shanghai University of Engineering Science, 2009, 23(4): 353-357. doi: 10.3969/j.issn.1009-444X.2009.04.017
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Design of Detection System for Electronic Scale Chip Cheating

doi: 10.3969/j.issn.1009-444X.2009.04.017
  • Publish Date: 2009-12-30

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