Volume 30 Issue 2
Jun.  2016
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Article Navigation >  Journal of Shanghai University of Engineering Science  > 2016  >  30(2): 160-162
WANG Yuwei, HUANG Fei, XIONG Feng, ZHU Pengfei, ZHU Kun. Resistance Characteristics of Si-Si0.7Ge0.3-Si Structure[J]. Journal of Shanghai University of Engineering Science, 2016, 30(2): 160-162. doi: 10.3969/j.issn.1009-444X.2016.02.013
Citation: WANG Yuwei, HUANG Fei, XIONG Feng, ZHU Pengfei, ZHU Kun. Resistance Characteristics of Si-Si0.7Ge0.3-Si Structure[J]. Journal of Shanghai University of Engineering Science, 2016, 30(2): 160-162. doi: 10.3969/j.issn.1009-444X.2016.02.013
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Resistance Characteristics of Si-Si0.7Ge0.3-Si Structure

doi: 10.3969/j.issn.1009-444X.2016.02.013
  • Publish Date: 2016-06-30

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