Volume 34 Issue 1
Mar.  2020
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Article Navigation >  Journal of Shanghai University of Engineering Science  > 2020  >  34(1): 59-64
HUANG Tao, LIAO Qiuhui, LUO Cheng, CHEN Zhongwei. Failure Behavior Analysis of Gold Wire Sweep of Plastic-Encapsulated Discrete Device[J]. Journal of Shanghai University of Engineering Science, 2020, 34(1): 59-64. doi: 10.3969/j.issn.1009-444X.2020.01.011
Citation: HUANG Tao, LIAO Qiuhui, LUO Cheng, CHEN Zhongwei. Failure Behavior Analysis of Gold Wire Sweep of Plastic-Encapsulated Discrete Device[J]. Journal of Shanghai University of Engineering Science, 2020, 34(1): 59-64. doi: 10.3969/j.issn.1009-444X.2020.01.011
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Failure Behavior Analysis of Gold Wire Sweep of Plastic-Encapsulated Discrete Device

doi: 10.3969/j.issn.1009-444X.2020.01.011
  • Publish Date: 2020-03-30

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